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Electrical and Electronics Engineering Journal, Iris Recognition, Biometrics, Features, Database, Wavelets, Histograms,
Phase, Shape, Texture, Color, Transform, Content-based Image Retrieval, Iris Recognition Technology, Machine Readable Passport, MRP, Public Key Infrastructure, PKI, Forensic Application, Support Vector Machine, SVM, National Television Systems Committee, NTSC, Direct
Linear Discriminant Analysis, DLDA.
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